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Join Teledyne LeCroy @ DesignCon 2013

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Teledyne LeCroy will be showcasing advanced test instruments that drive product innovation by quickly measuring, analyzing, and verifying complex electronic signals in booth #209.

Have a drink on us! We will be serving beer from 4 pm - 6 pm on Tuesday January 29th at our booth.

Teledyne LeCroy is also offering a variety of in-depth training sessions that are open to all attendees. There is no charge to attend but space is limited! Sponsored technical training sessions and in-booth classes are included in your Free Expo Pass or any conference pass and can easily be selected during the online registration process.

Please note: Arrive early for best seating.


Technical Training Sessions

Meet the Teledyne LeCroy engineers for demos and discussions on:

  • LabMaster: the world's highest bandwidth - 65 GHz - oscilloscope
  • 12-port S-parameter analysis with SPARQ Signal Integrity Network Analyzer
  • Teledyne LeCroy's new 12-bit HDO high definition oscilloscope
  • End-to-end serial data test solutions including transmitter, receiver and protocol-enabled test
  • PCI Express and DDR protocol analysis
 

Sponsored Session: PCI Express 3.0 Characterization, Compliance, and Debug for Signal Integrity Engineers
Speaker - David Li, Product Marketing Manager, Serial Data Standards, Teledyne LeCroy

Case of the Closed Eye: A Growing 100G Dilemma

Speaker - Chris Loberg, Senior Technical Marketing Manager, Tektronix-Danaher
Speaker - Ransom Stephens, Science Writer, Ransom's Notes
Speaker - Greg Lecheminant, Technical Applications Engineer, Agilent Technologies
Speaker - Mark Marlett, Design Architect, Analog Bits
Speaker - Pavel Zivny, Technologist, Tektronix

Speed Training: A Potpourri of SI Puzzlers
Speaker - Eric Bogatin, Signal Integrity Evangelist, Bogatin Enterprises

A Fast and Inexpensive Method for PCB Trace Characterization in Production Environments (Location: Ballroom H)
Speaker - Peter Pupalaikis , Vice President, Technology Development, Teledyne LeCroy
Speaker - Kaviyesh Doshi, Senior DSP Engineer, Teledyne LeCroy

Dramatic Noise Reduction Using Guard Traces with Optimized Shorting Vias
Speaker - Eric Bogatin, Signal Integrity Evangelist, Bogatin Enterprises
Speaker - Bert Simonovich, President, Lamsim Enterprises Inc.

Which One Is Better? Comparing Options to Describe Frequency Dependent Losses
Speaker - Eric Bogatin, Signal Integrity Evangelist, Bogatin Enterprises
Speaker - Yuriy Shlepnev, President, Simberian
Speaker - Paul Huray, Professor, University of South Carolina
Speaker - Don DeGroot, P+O74resident, CCN Labs

Ask the Experts, ...Anything Goes
Speakers - Eric Bogatin, Signal Integrity Evangelist, Bogatin Enterprises
Panelist - Jeff Loyer, Engineer, Intel
Panelist - Lee Hill, Founding Partner, SILENT Solutions LLC
Panelist - Steve Weir, CTO, IPBlox
Panelist - Jim Nadolny, Sr. SI&EMI Engineer, Samtec
Panelist - Don DeGroot, P+O74resident, CCN Labs

Understanding Apparent Increasing Random Jitter with Increasing PRBS Test Pattern Lengths
Speaker - Martin Miller, Chief Scientist, Teledyne LeCroy

Sponsored Session: Debugging to Find the Root Cause of Compliance, Limit or Mask Test Violations
Speaker - Alan Blankman, Technical Product Marketing Manager, Signal Integrity, Teledyne LeCroy


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