| Category/Track | Title | Speakers/Co-Authors |
|---|---|---|
| Analog, Mixed-Signal, and RF Design and Verification | Applying Microwave Techniques to Digital Systems: A Simple Case Study | Andrew Becker, Cray; Michael Higgins, Cray; Michael Steinberger, SiSoft; Paul Wildes, SiSoft |
| Analog, Mixed-Signal, and RF Design and Verification | Enabling DFT Logic and Timing Verification in Mixed-Signal Designs | Bing Chuang, Rambus ; Sumit Vishwakarma, Synopsys; Kaneez Tumpa, RambusĀ |
| Chip-Level Design for Signal/Power Integrity | Power/Ground Bump Optimization Technique on Early Design Stage | Youngsoo Lee, Samsung Electronics; Dongyoun Yi, Samsung Electronics |
| Chip-Level Design for Signal/Power Integrity | 3D Si Interposer Design and Electrical Performance Study | Mandy (Ying) Ji, Rambus; Ming Li, Rambus; Julia Cline, Rambus; David Secker, Rambus; Kevin Cai, Rambus; John Lau, ITRI; Pei-Jer Tzeng, ITRI; Chau-Jie Zhan, ITRI; Ching-Kuan Lee, ITRI |
| Designing with Programmable Architectures | A Rapid Prototyping of FPGA-Based Duobinary Transmitter/Receiver for High-Speed Electrical Backplane Transmission | Ashraf Umar, Penn State Harrisburg; Aldo Morales, Penn State Harrisburg; Sedig Agili, Penn State Harrisburg; Mike Resso, Agilent; Marcel Christoph Welpot, Penn State Harrisburg |
| Electromagnetic Compatibility and Interference | Validating EMC Simulation by Measurement in Reverberation Chamber | Xiaoxia Zhou, Cisco Systems; Jing Li, Cisco Systems; Hongmei Fan, Cisco Systems; Alpesh Bhobe, Cisco Systems; Kam Taunk, Cisco Systems; Jinghan Yu, Cisco Systems; Philippe Sochoux, Cisco Systems |
| Electromagnetic Compatibility and Interference | Effects of Nearby Ground Vias on High Speed Single-Ended and Differential Signals | Alma Jaze, IBM; Bruce Archambeault, IBM; Sam Connor, IBM |
| High-Speed Serial Design | Signal and Power Integrity (SPI) Co-Analysis for High-Speed Communication Channels | Renato Rimolo-Donadio, IBM T.J. Watson Research Ctr; Xiaomin Duan, Technical University of Hamburg-Harburg; Young H. Kwark, IBM T.J. Watson Research Center; Xiaoxiong Gu, IBM T.J. Watson Research Center; Christian W. Baks, IBM T.J. Watson Research Center; Sebastian Mueller, Technical University of Hamburg-Harburg; Thomas-Michael Winkel, IBM Research and Development; Thomas Strach, IBM Research and Development; Lei Shan, IBM T.J. Watson Research Center; Hubert Harrer, IBM Research and Development; Christian Schuster, Technical University of Hamburg-Harburg |
| High-Speed Serial Design | Time-Domain and Statistical Model Development, Correlation, and Analysis Methods for High-Speed SerDes | Xingdong Dai, LSI; Fangyi Rao, Agilent Technologies; Shiva Prasad Kotagiri, LSI; John Baprawshi, LSI; Cathy Ye Liu, LSI |
| High-Speed Serial Design | Channel Operating Margin (COM): Evolution of Channel Specifications for 25 Gbps and Beyond | Richard Mellitz, Intel; Adee Ran, Intel; Mike Li, Altera; Vira Ragavassamy, IntelĀ |
| High-Speed Serial Design | Beyond 25 Gbps: A Study of NRZ and Multi-Level Modulation in Alternative Backplane Architectures | Adam Healey, LSI ; Chad Morgan, TE Connectivity; Megha Shanbhag, TE Connectivity |
| High-Speed Signal Processing, Equalization and Coding | Design and Analysis of a High-Speed Parallel Interface for 16 Gbps Coded Differential Signaling | Wendemagegnuhu T. Beyene, Rambus; Amir Amirkhany, Rambus; Kambiz Kaviani, Rambus; Aliazam Abbasfar, Rambus |
| High-Speed Signal Processing, Equalization and Coding | Partial Response and Noise Predictive Maximum Likelihood (PRML/NPML) Equalization and Detection for High-Speed Serial Link Systems | Pervez Aziz, LSI; Cathy Ye Liu, LSI; Adam Healey, LSI |
| Jitter, Crosstalk, and Noise Analysis | Dramatic Noise Reduction Using Guard Traces with Optimized Shorting Vias | Eric Bogatin, Bogatin Enterprises; Lambert Simonovich, Lamsim EnterprisesĀ |
| Jitter, Crosstalk, and Noise Analysis | Measurement-Based Simulation: Increasing IBIS-AMI Model Accuracy with Data from Lab Measurements | Michael Steinberger, SiSoft; Paul Wildes, SiSoft; Anders Ekholm, Ericsson AB; Nicke Svee, Ericsson AB |
| Parallel and Memory Interface Design | DDR Memory Channel Design from Passive Stub Equalizer Perspective | Jongbae Park, Intel; Myunghyun Ha, Intel; Qin Li, Intel |
| Parallel and Memory Interface Design | Accurate Receiver Clock Positioning in High-Speed Parallel Buses | Arun Vaidyanath, Rambus; Dan Oh, Altera; Christopher Madden, Rambus; Yohan Frans, Rambus; Woopoung Kim, Qualcomm |
| PCB Design Tools and Methodologies | Channel to Channel Crosstalk Behavior and Design Optimization for DDR4 Signaling | Xiang Li, Intel; James McCall, Intel |
| PCB Materials, Processing and Characterization | Analytic Solutions for Periodically Loaded Transmission Line Modeling | Priya Pathmanathan, Intel; Paul Huray, University of South Carolina; Steve Pytel, ANSYS |
| PCB Materials, Processing and Characterization | Which One Is Better? Comparing Options to Describe Frequency Dependent Losses | Eric Bogatin, Bogatin Enterprises; Don DeGroot, CCN Labs; Paul Huray, University of South Carolina; Yuriy Shlepnev, Simberian |
| Power Integrity and Power Distribution Network Design | Innovative PDN Design Guidelines for Practical High-Layer-Count PCBs | Ketan Shringarpure, Missouri S&T; Siming Pan, Cisco Systems; Jingook Kim, UNIST; Brice Achkir, Cisco Systems ; Bruce Archambeault, IBM; Jun Fan, Missouri S&T; James Drewniak, Missouri S&T |
| Power Integrity and Power Distribution Network Design | Memory Interface On-Chip PDN Noise Characterization, Modeling and Its Impact on Timing | Bipin Dhavale, Altera; June Feng, Altera; Yuri Tretiakov, Altera; Janani Chandrasekhar, Altera; Shishuang Sun, Altera; Mayra Sarmiento, Altera; Sunitha Chandra, Altera; Daniel Chow, Altera, Aman Aflaki, Altera |
| Power Integrity and Power Distribution Network Design | Power-Signal Co-integrity Design for Multi-Gbps Low-Power DDR3 Mobile Platforms | Weiliang Yuan, Samsung Electronics; Seungbae Lee, Samsung Electronics; Chanmin Jo, Samsung Electronics; Woonghwan Ryu, Samsung Electronics; Sangmin Lee, Samsung Electronics |
| Signal Propagation Analysis Techniques | A Reverse Nyquist Approach to Understanding the Importance of Low-Frequency Information in Scattering Matrices | Daniel Dvorscak, ANSYS; Michael Tsuk, ANSYS |
| System Co-Design: Chip/Package/Board | A Reusable Generic Platform for Validation and Characterization of High Speed Mixed Signal Designs | Sanku Mukherjee, Rambus; Narayanan Mayandi, Rambus; Brian Tsang, Rambus; Sreeja Menon, Rambus; Benedict Lau, Rambus; Norman Chan, Rambus; Arul Sendhil, Rambus |
| System Co-Design: Chip/Package/Board | Using Power Aware IBIS v5.0 Behavioral IO Models to Simulate Simultaneous Switching Noise | Romi Mayder, Xilinx; Chris Wyland, Xilinx; Bradley Brim, Cadence; Yingxin Sun, Cadence |
| Test and Measurement Methodology | High-Throughput, High-Sensitivity Measurement of Power Supply-Induced Bounded, Uncorrelated Jitter in Time, Frequency, and Statistical Domains | Daniel Chow, Altera; Yujeong Shim, Altera; Shishuang Sun, Altera |
| Test and Measurement Methodology | Terabit/s Packaging Design for Testing of High-Speed Integrated Circuits | Christian W. Baks, IBM T.J. Watson Research Center; Renato Rimolo-Donadio, IBM T.J. Watson Research Center; Young H. Kwark, IBM T.J. Watson Research Center; Fuad Doany, IBM T.J. Watson Research Center; Xiaoxiong Gu, IBM T.J. Watson Research Center; Daniel Kuchta, IBM T.J. Watson Research Center; Benjamin Lee, IBM T.J. Watson Research Center; Alexander Rylyakov, IBM T.J. Watson Research Center; Frank Libsch, IBM T.J. Watson Research Center; Clint Schow, IBM T.J. Watson Research Center |