• Conference
    Jan 29–31, 2019
  • Expo
    Jan 30–31, 2019
  • Santa Clara Convention
    | Santa Clara, CA

Gigatest Labs developed the GTL65_Series and GTL40_Series of microwave probes to solve the recurring problem engineers experience with probe tip breakage when contacting non-planar PCB surfaces. The optimized design of the GTL65 and 40_Series Microwave probes provides the durability, contact compliance, and long-life span for day-to-day engineering measurement tasks.