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PAPER LIBRARY
Measurement-Assisted Electromagnetic Extraction of Interconnect Parameters on Low-Cost FR-4 boards for 6-20 Gb/sec Applications

Scott McMorrow, President, Teraspeed Consulting Group
Alfred Neves, Senior Staff Signal Integrity Engineer, Teraspeed Consulting Group
Tom Dagostino, VP Device Modeling Group, Teraspeed Consulting Group
Yuriy Shlepnev, President, Simberian
Design of interconnects on PCBs for 6-10 Gb/s data rates requires electromagnetic models from DC up to 20 GHz. Manufacturers of low-cost FR-4 PCBs typically provide values for dielectric constant and loss tangent either at one frequency or without specifying frequency value at all, that is not acceptable for the broad-band models. A simple and practical methodology to extract frequency-dependent dielectric parameters on the base of correlation of measurements and simulations is proposed. A board with 30 test structures has been built to validate the extraction methodology and to verify possibilities to predict interconnect parameters with the electromagnetic analysis.
IEC
DesignCon 2010
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