Mr. Kvamme has more than 19 years experience in the mass storage industry and with physical interfaces. His focus has been on interface signal integrity, characterization, and industry standards definition. He authored the ATA/66, 100, and 133 extensions to the ATA/ATAPI specification and was a leading participant in the SATA Electrical, Jitter, and Measurement subcommittees during the development of SATA. His current work involves developing and automating specification compliance and characterization test methods for bench testing high speed serial interface hardware. He holds B.S. and M.S. Engineering degrees from Harvey Mudd College (1989/1990).

Mr. Fetz graduated from California Polytechnic State University at San Luis Obispo in 1983 and completed a Masters in Electrical Engineering from the University of Idaho in 1991. Before his current position, he worked on Agilent's Bluetooth and Signal Integrity solutions and prior to that his focus was in manufacturing where he has worked as a production engineer and test engineer for Base Station and Mobile testing products.

Dr. Mike Peng Li is a corporate expert and adviser on jitter, noise and high-speed link, and SERDES architecture. He is co-chairman for PCI Express jitter standard committee. In 2007, Dr. Li was chief technology officer at Wavecrest Corporation.

Mark is a SERDES Architect at Xilinx with 20 years of SERDES design experience. His primary focus on circuit topology, standards and manufacturability of SERDES. Mark has contributed to PCIE gen 1.1 and gen2. Fibre Channel, SAS, SATA in the areas of jitter decomposition and measurement.

Dr. Miller has been a hands-on engineer and designer at LeCroy for 29 years. He has contributed analog, digital, and software designs, and during the last 16 years, he has focused on measurement-and-display software capabilities for LeCroy scopes.

Dr. Stephens' company, Ransom's Notes, produces and presents content at every level of technical sophistication to help engineers advance to technology's cutting edge. He is the author of more than 200 articles in the electronics industry, science journals, and magazines.

With over 25 years experience in BER measurements and 12 patents, Tom and his team create measurement methods for testing serial streams with emphasis on high-fidelity bit decision. Author of many articles, webcasts and app. notes, Tom holds CS and EE degrees from Hiram College, M.I.T. and Stanford.

Mr. Zivny works with the sampling oscilloscopes group of Tektronix. Over the years he has been involved in test, design, and marketing of both real-time and sampling oscilloscopes, and has several oscilloscope-related patents awarded and pending.