BEGIN:VCALENDAR
VERSION:2.0
METHOD:PUBLISH
BEGIN:VEVENT
CLASS:PUBLIC
PRIORITY:3
SEQUENCE:0
UID:1012010300
SUMMARY:DesignCon 2010 - TF-MA3 | Tutorial - USB 3.0 Verification and Test Challenges
LOCATION:Santa Clara Convention Center, Santa Clara, California 
DTSTART:20100201T150000Z
DTEND:20100201T180000Z
DTSTAMP:20100203T164634Z
DESCRIPTION:The seminar will focus on qualifying and testing components and devices in the development of SuperSpeed USB solutions.
END:VEVENT
END:VCALENDAR