DesignCon 2010DesignCon 2010
DesignCon 2010
DesignCon 2010Program Schedule
12-WA4
Practical Study of Appropriate Measurement Bandwidth and Noise, Along with its Impact on Oscilloscope based Time and Frequency Measurements
Wednesday, February 3 | 11:00 am – 11:40 am

Mark Lombardi, Application Specialist, Digital Test Division, Agilent Technologies
Mark Robinson, Microwave Network analyzer Applications Engineer, Agilent Technologies

The study of noise seems to be an endless "peeling of an onion", once one source is understood, the next emerges just below it. This paper focuses on a practical study of noise and how using appropriate bandwidth can minimize its effects on various digital and RF measurements made using an oscilloscope.

DesignCon 2010
DC 2010 Program
Preview the event program guide
DC 2010 Program
View the Exhibitor Product Guide
FEATURED EVENTS
IEC IEC
OFFICIAL HOST SPONSOR
Agilent Technologies
IP SUMMIT SPONSOR
ChipEstimate.com
CORPORATE PARTNER
Rambus
DIAMOND SPONSORS
LeCroy
LeCroy
GOLD SPONSORS
Mentor Graphics
SILVER SPONSORS
SILVER SPONSORS MoSys
CORPORATE REGISTRATION SPONSORS
Altera
Cisco
Ericsson
National Semiconductor
Sun Microsystems
Xilinx
DesignCon - Sponsors
SPONSORED BY
IEC

CONTACT:

CHRISTINE PAPLACZYK
Exhibit Sales Director

Phone: +1-312-559-4616
E-mail: cpaplaczyk@iec.org

In00foVault Sponsor SiSo

CHIPHEAD'S SOCIAL NETWORKS
DesignCon 2010