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PRIORITY:3
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UID:101201074
SUMMARY:DesignCon 2010 - 12-WA4 | Practical Study of Appropriate Measurement Bandwidth and Noise, Along with its Impact on Oscilloscope based Time and Frequency Measurements 
LOCATION:Santa Clara Convention Center, Santa Clara, California 
DTSTART:20100203T170000Z
DTEND:20100203T174000Z
DTSTAMP:20100203T151034Z
DESCRIPTION:The study of noise seems to be an endless "peeling of an onion", once one source is understood, the next emerges just below it. This paper focuses on a practical study of noise and how using appropriate bandwidth can minimize its effects on various digital and RF measurements made using an oscilloscope.
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