Monday, February 4 |
| TIME |
SESSION |
LOCATION |
| 9:00 – 12:00 |
TF-MA1 | Tutorial
Practical Techniques for Understanding, Modeling, and Efficiently Suppressing the Noise Coupling through Chip, Package, and PCB in Mixed-Signal Integrated Circuits and Systems-on-Chip
|
Ballroom E |
|
TF-MA2 | Tutorial
Signal Integrity Measurement Methods and Practices
|
Ballroom F |
|
TF-MA3 | Tutorial
Impact of Power Management Techniques on SoC Design and Verification
|
Ballroom G |
|
TF-MA4 | Tutorial
Fixturing and Calibration Techniques for Obtaining Wide Bandwidth Measured Data for Time Domain Simulations and Measurement-Based Modeling
|
Ballroom H |
|
TF-MA5 | Tutorial
Ensuring Functional Closure of a Complex SoC Through Verification Planning, Implementation and Execution
|
Room 209/210 |
| 12:30 – 1:00 |
Monday Keynote Luncheon
|
Great America Ballroom JK |
| 1:30 – 4:30 |
TF-MP1 | Tutorial
CoReUse/QCore - Industry’s First Design Reuse Methodology with Compliance Checking Tool
|
Ballroom E |
|
TF-MP2 | Tutorial
Advances in Gigabit Channel Measurement-Based Characterization and Simulation
|
Ballroom F |
|
TF-MP3 | Tutorial
Design and Verification for High-Speed I/Os at Multiple to >10 Gbps with Jitter and Signal Integrity Optimization
|
Ballroom G |
|
TF-MP4 | Tutorial
Understanding Grounding Concepts in EM Simulators — What the Signal
|
Ballroom H |
|
TF-MP6 | Tutorial
Low Power Flows and Formats: From ESL to Implementation
|
Room 203/204 |
| 4:45 – 6:00 |
Technical Panel
How Can Semiconductor Designers Meet High Performance/Low Power Requirements for Customers by Providing Greater Choice at Advanced Technology Nodes?
|
Ballroom E |
|
Technical Panel
The Case of the Closing Eye - Addressing the Industry's Next-Gen Serial Data Design Validation Challenges
|
Ballroom F & G |
|
Technical Panel
Power Distribution Planes: to Split or Not to Split?
|
Ballroom H |
Tuesday, February 3 |
| TIME |
SESSION |
LOCATION |
| 8:30 – 9:10 |
3-TA1
Achieve Higher Performance and Lower Power Consumption for Mass Storage Designs with SATA Device IP
|
Ballroom H |
|
6-TA1
Analysis of cross talk between signals routed over discontinuous reference plane
|
Great America Ballroom J |
|
7-TA1
Optimizing Connector Models for Signal Integrity Use
|
Great America Ballroom K |
|
8-TA1
The use of Optimization in Signal Integrity performance Centric High Speed Digital Design Flows
|
Ballroom E |
|
10-TA1
FPGA/ASIC Pre-driver PDN SSN and Its Impact on SSJ
|
Ballroom F |
|
13-TA1
Active Cancellation of Noise Coupling in Mixed-Signal Integrated Circuits: Methodology, Design Examples, and Experimental Results
|
Ballroom G |
| 8:30 – 10:00 |
Business Forum Panel
Design This! New Strategies for New Devices
|
Room 203/204 |
|
3-TA2
Configurable DAC for Mixed-Signal SoC Integration, with Maximum Design re-usability
|
Ballroom H |
|
6-TA2
Incorporating SSN Analysis in Constraint-Based System Design
|
Great America Ballroom J |
|
7-TA2
Practical Analysis of Backplane Vias for 5 Gbps and Above
|
Great America Ballroom K |
|
8-TA2
Quantifying Crosstalk Induced Jitter in Multi-lane Serial Data Systems
|
Ballroom E |
|
10-TA2
A novel methodology to handle the layout constraints for designing an optimal Power Delivery Network
|
Ballroom F |
|
13-TA2
Fully Analytical Methodology for Fast End-to-End Link Analysis on Complex Printed Circuit Boards including Signal and Power Integrity Effects
|
Ballroom G |
|
14-TA2
Web 2.0 Tools for Engineers
|
Room 209/210 |
| 10:10 – 10:50 |
2-TA3
High-Speed SerDes Design and Verification using an EDA-based Silicon-Accurate Behavioral Modeling and Simulation Methodology
|
Room 209/210 |
|
3-TA3
Intellectual Property - Fraud Protection
|
Ballroom H |
|
4-TA3
Worst Case Switching Pattern for Core Noise Analysis
|
Great America Ballroom J |
|
7-TA3
Performance Calibration of High Speed Serial Links
|
Great America Ballroom K |
|
8-TA3
Analysis of Random Noise and the Effect of Band-Limited Noise on Stressed-Eye Receiver Tolerance Tests
|
Ballroom E |
|
13-TA3
De-embed Probe with New Switched Load Tip Technology
|
Ballroom G |
| 10:10 – 11:40 |
Business Forum Panel
Embracing a New Paradigm: EDA Tools and IP as Solutions
|
Room 203/204 |
| 11:00 – 11:40 |
2-TA4
Multivariate Multi-objective Analog Design Optimization using High-Level Analog Testbenches
|
Room 209/210 |
|
3-TA4
Towards Harnessing the True Potential of IP Reuse
|
Ballroom H |
|
4-TA4
System IO Planning and Design Feasibility ? Challenges and Solutions
|
Great America Ballroom J |
|
7-TA4
A Signal Integrity Comparison of 25 Gbps Backplane Systems Using Varying High-Density Connector Performance Levels
|
Great America Ballroom K |
|
8-TA4
A New Physical Mechanism-Based Jitter Classification Method and Its Applications
|
Ballroom E |
|
10-TA4
Power-gating design tradeoffs and considerations for production low-power designs
|
Ballroom F |
|
13-TA4
Verify Your Signal Integrity Margins: De-Embedding of Fixtures and Probing in a Real-Time Digital Oscilloscope
|
Ballroom G |
|
UNIV
Design challenges for Next Generation High Speed Ethernet; 40 and 100GbE
|
Room 212 |
| 11:50 – 12:30 |
Tuesday Keynote Address
|
Great America Ballroom JK |
| 2:00 – 2:40 |
1-TP1
A Case Study: Critical Area and Critical Feature Analysis of Production 90nm Designs at LSI Corporation
|
Room 209/210 |
|
3-TP1
C++ IP Design and Reuse
|
Ballroom H |
|
5-TP1
Common Mode Effects on Multigigabit-per-second Interconnects
|
Ballroom J |
|
6-TP1
Analyzing Signal and Power Integrity Limitations for Mobile Memory Systems in PoP Environments
|
Great America Ballroom K |
|
8-TP1
Comparison of BER Estimation Methods which Account for Crosstalk
|
Ballroom E |
|
11-TP1
The Application of High Speed Serial Interfaces to Highly Sensitive EMI Applications
|
Ballroom F |
|
12-TP1
Guidelines for Multiport and Mixed-Mode S-Parameter Measurements in High-Speed Interconnection Design
|
Ballroom G |
| 2:00 – 3:30 |
Business Forum Panel
Collaboration across the Changing Design Chain
|
Room 203/204 |
| 2:50 – 3:30 |
1-TP2
Equation-Based DRC: A Novel Approach to Resolving Complex nm Design Issues
|
Room 209/210 |
|
3-TP2
Skeleton, an Approach to Maximize Reuse across Multiple Product Families
|
Ballroom H |
|
5-TP2
A Simple Via Experiment
|
Great America Ballroom J |
|
8-TP2
Noise and Jitter Analysis for PLL-based Frequency Synthesizer
|
Ballroom E |
|
11-TP2
Control of Electro-Magnetic Radiation from Integrated Circuit Heat sinks
|
Ballroom F |
|
12-TP2
Contactless vector network analysis - A new approach for S-Parameter measurements
|
Ballroom G |
| 3:45 – 5:00 |
Technical Panel
Selecting IP in a Complex Design Environment
|
Ballroom F |
|
Technical Panel
Multi-die Chip/Package Co-design for SiP Applications
|
Ballroom G |
|
Technical Panel
High-speed channel designs - Challenges and solutions
|
Ballroom H |
|
Business Forum Panel
New Media/New Marketing: Using On-Line Media to Gain a Competitive Edge
|
Room 203/204 |
Wednesday, February 4 |
| TIME |
SESSION |
LOCATION |
| 8:45 – 9:25 |
1-WA1
A Self-Adaptable Slew Rate Control Variable Power Supply Output Buffer for Embedded Microcontroller
|
Room 209/210 |
|
4-WA1
Feasibility of Multi-Gigabit Memory Interface in LQFP Packages
|
Ballroom H |
|
6-WA1
A Study of Transmission Technology to Support 25 Gbps Serial Signaling for Parallel Architectures in Multi-Board Coplanar PCB Systems
|
Great America Ballroom J |
|
7-WA1
Crosstalk in High-Speed Via Pin Fields Including the Impact of Power Distribution Structures
|
Great America Ballroom K |
|
10-WA1
Prediction and Measurement of Supply Noise Induced Jitter in High-Speed I/O Interfaces
|
Ballroom E |
|
12-WA1
Measurement-Assisted Electromagnetic Extraction of Interconnect Parameters on Low-Cost FR–4 boards for 6–20 Gbps Applications
|
Ballroom G |
|
13-WA1
Crosstalk Amplification by Resonance
|
Ballroom F |
|
14-WA1
Modeling Design Services for Improving Service Delivery Effectiveness
|
Room 203/204 |
| 9:20 – 10:00 |
1-WA2
Design Space Exploration for High-Performance Signal-Processing Hardware Using ESL Design Methodology
|
Room 209/210 |
| 9:40 – 10:20 |
4-WA2
Broadband Methodology for Power Distribution System Analysis of Chip, Package, and Board for High-Speed IO Design
|
Ballroom H |
|
6_WA2
Clock Jitter Reduction in High Speed Interfaces
|
Great America Ballroom J |
|
7-WA2
Methodology of Characterizing Chip-to-Chip Serial Interconnects with AC Coupling Capacitors
|
Great America Ballroom K |
|
9_WA2
Adaptive Transmit Equalization for Hybrid Optical-Electrical Links Operating at Speeds up to 17.0 GB
|
Ballroom E |
|
12-WA2
VNA Characterization of Cable Assemblies for Supercomputer Applications
|
Ballroom G |
|
13_WA2
40 Gbps Pre-Emphasized Serializer, Equalizer, and CDR CMOS Circuit Design with Full Channel Simulation
|
Ballroom F |
|
14-WA2
Business considerations for systems with RAM-based FPGA configuration
|
Room 203/204 |
| 10:15 – 10:55 |
1-WA3
Analog Chip-Level Behavioral Modeling Using SVM Kernel-Based Data Mining Techniques
|
Room 209/210 |
|
4-WA3
Design Optimization of High Speed Digital Systems
|
Ballroom H |
|
5-WA3
Bounding the Glass Weave Effect through Simulation
|
Great America Ballroom J |
|
7-WA3
How Long is too Long? A Via Stub Electrical Performance Study
|
Great America Ballroom K |
|
9-WA3
Pseudo-Differential Vector Signaling for Noise Reduction in Single-ended Signaling Systems
|
Ballroom E |
|
10-WA3
Examining the impact of split planes on signal and power integrity
|
Ballroom F |
|
12-WA3
Characterizing Non-Standard Impedance Channels with 50 Ohm Instruments
|
Ballroom G |
| 11:05 – 11:45 |
1-WA4
Method and Apparatus of Continuous PLL Adaptation to Variable Reference Input Frequency
|
Room 209/210 |
|
4-WA4
Time and Frequency Analysis of Signal-Noise as a Function of Power-Noise and vice versa
|
Ballroom H |
|
5-WA4
Power Integrity Effects of High Density Interconnect (HDI)
|
Great America Ballroom J |
|
7-WA4
BER Performances for High-Speed Serial Link System Estimated by using Quasi-Analytical Method
|
Great America Ballroom K |
|
9-WA4
New Methods of Measuring the Performance of Equalized Serial Data Links and Correlation of Performance Measures across the Design Flow, from Simulation to Measurement, and Final BER Tests
|
Ballroom E |
|
11-WA4
Common Mode EMI From Disk Drive Gigabit Serial Interfaces
|
Ballroom F |
|
12-WA4
Application of Launch Point Extrapolation Technique to Measure Characteristic Impedance of High-Frequency Cables with TDR
|
Ballroom G |
| 2:00 – 2:40 |
2-WP1
Formal Verification of Multi-level Model System using UPF
|
Room 209/210 |
|
4-WP1
SSO Noise, Eye Margin, and Jitter Characterization for I/O Power Integrity
|
Ballroom H |
|
5-WP1
Achieving 100 Percent PCB/Substrate-Level ESD Protection to 30 KV Using VSD™ Nano-Composites
|
Great America Ballroom J |
|
6-WP1
The Design and Signal Integrity Analysis of a TB/sec Memory System
|
Great America Ballroom K |
|
9-WP1
Statistical Analog Front End and Decision Feedback Equalization
|
Ballroom E |
|
10-WP1
An Efficient Time-Domain Method for the Analysis and Design of the Decoupling Networks in High-Speed
|
Ballroom F |
|
12-WP1
Platform Validation using Intel? IBIST
|
Ballroom G |
|
Business Forum Panel
Do It Right or Do It Over? Signal Integrity Engineer in the Era of Highly Compressed Project Schedules
|
Room 203/204 |
| 2:50 – 3:30 |
2-WP2
Using a Memory Access Pattern Test Suite to Predict System Performance
|
Room 209/210 |
|
4-WP2
The Effects of Chip and Board Behavior on Package-Centric, System-Aware Power Delivery Design
|
Room 209/210 |
|
5-WP2
Advances in Plating Technology
|
Great America Ballroom J |
|
7-WP2
Interconnect Design Optimization and Characterization for Advanced High-Speed Backplane Channel Links
|
Great America Ballroom K |
|
9-WP2
40/100 Gbps Transmission over Copper: Myths and Realities
|
Ballroom E |
|
11-WP2
EMI from Multi-Gigabit SerDes Differential Pairs
|
Ballroom F |
|
12-WP2
Characterizing Jitter Transfer in Clock Circuits
|
Ballroom G |
| 3:45 – 5:00 |
Business Forum Panel
Globalization of Product Engineering
|
Room 203/204 |
|
Technical Panel
Getting What You Pay for at 32 nm
|
Ballroom F |
|
Technical Panel
Power-Aware Verification: Is It a Front-End or a Back-End Issue?
|
Ballroom G |
|
Technical Panel
Measurements versus Simulations: Electrical Modeling at Future Data Rates and Physical Dimensions
|
Ballroom H |
Thursday, February 5 |
| TIME |
SESSION |
LOCATION |
| 9:00 – 9:40 |
10-TH1
Voltage Regulator Module and Power Distribution Network Optimization
|
Ballroom G |
|
12-TH1
Characterization and Focus Calibration of ATE Systems for High-Speed Digital Applications
|
Ballroom H |
|
13-TH1
Utilizing Electronic Dispersion Compensation (EDC) and embedded waveform viewing technologies in next generation backplanes
|
Ballroom E |
| 9:50 – 10:30 |
7-TH2
New Serial Link Simulation Process, 6 Gbps SAS Case Study
|
Ballroom F |
|
10-TH2
PCB Power Delivery Optimizations for the Cost-Driven Era
|
Ballroom G |
|
12-TH2
A Comparison of Fixture Removal Methods for Characterization of Differential PCB Channels
|
Ballroom H |
|
13-TH2
Noise Injection for Design Analysis and Debugging
|
Ballroom E |
| 10:40 – 11:20 |
10-TH3
Switching Voltage Regulator Noise Coupling Analysis for Printed Circuit Board Systems
|
Ballroom G |
|
12-TH3
High-Performance and Cost-Effective Time-Domain TRL (t-TRL) Calibration Technique for High-Speed PWC Characterization and Qualification
|
Ballroom H |
|
13-TH3
Leveraging Probe De-Embedding Technique for Multi-Gigabit FPGA Package Characterization
|
Ballroom E |