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Technical Panel
The Case of the Closing Eye - Addressing the Industry's Next-Gen Serial Data Design Validation Challenges
Monday, February 2 – 4:45 pm - 6:00 pm

As multi-gigabit data rates become common in digital systems, signal integrity is a paramount concern for designers. This concern has risen with recent speed increases for second- and third-generation standards such as PCI Express and Serial ATA. With the addition of signal equalization techniques at the transmitter and receiver, the physical-layer validation approach becomes more complex, requiring a system-wide view of signal characteristics that impact the eye opening. This panel will address the latest challenges in today's leading-edge labs and discuss various validation approaches.

Chairperson
Chris Loberg
Senior Manager, Business Instruments
Tektronix

Mr. Loberg was previously responsible for marketing management of Optical Communications Test Products at Tektronix. Prior to Tektronix, he was vice president of marketing for Utah Scientific, a manufacturer of telecom switching equipment, and vice president of sales and marketing for Texscan, a manufacturer of cable television infrastructure equipment. Mr. Loberg holds an M.B.A. in marketing from San Jose State University.

Speakers
Jay Diepenbrock
Senior Technical Staff Member in the Integrated Supply Chain
IBM
Mr. Diepenbrock is currently a senior technical staff member in the Interconnect Qualification Engineering department in IBM’s Integrated Supply Chain, working on the electrical testing and modeling of connectors and cables.
Karl Kachigan
SI Applications Manager
Agilent Technologies

Mr. Kachigan is responsible for the SI marketing efforts at Agilent Technologies. He has application and product management experience in oscilloscopes, VNAs, and EEsof simulation tools. He has over 30 years experience with Agilent/HP and holds BSEE and MSEE degrees from Stanford University.

Eric Kvamee
Principal Engineer, SerDes Design
LSI Corporation
Mike Li
Principal Architect
Altera

Dr. Mike Peng Li is a corporate expert and adviser on jitter, noise and high-speed link, and SERDES architecture. He is co-chairman for PCI Express jitter standard committee. In 2007, Dr. Li was chief technology officer at Wavecrest Corporation.

Mark Marlett
Senior Principal Engineer
Xilinx
Martin Miller
Chief Scientist, Research and Development
LeCroy Corporation

Dr. Miller has been a hands-on engineer and designer at LeCroy for 29 years. He has contributed analog, digital, and software designs, and during the last 16 years, he has focused on measurement-and-display software capabilities for LeCroy scopes.

Ransom Stephens
Writer, Physicist, Public Speaker
Ransom's Notes

Dr. Stephens’ company, Ransom's Notes, produces and presents content at every level of technical sophistication to help engineers advance to technology's cutting edge. He is the author of more than 200 articles in the electronics industry, science journals, and magazines. Dr. Stephens has introduced new measurement techniques for electrical and optical systems, invented methods for extracting signals from noise, led an engineering commando team, and served on high data-rate standards committees.

Tom Waschura
Chief Technology Officer
SyntheSys Research
With over 25 years experience in BER measurements and 12 patents, Tom and his team create measurement methods for testing serial streams with emphasis on high-fidelity bit decision. Author of many articles, webcasts and app. notes, Tom holds CS and EE degrees from Hiram College, M.I.T. and Stanford.
Pavel Zivny
Senior Application Engineer
Tektronix, Inc.

Mr. Zivny works with the sampling oscilloscopes group of Tektronix. Over the years he has been involved in test, design, and marketing of both real-time and sampling oscilloscopes, and has several oscilloscope-related patents awarded and pending.

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