Schedule
1-TP2
Equation-Based DRC: A Novel Approach to Resolving Complex nm Design Issues
Tuesday, February 3 | 2:50 pm – 3:30 pm
David Abercrombie, DFM Program Manager, Design-to-Silicon, Mentor Graphics
John Ferguson, Product Marketing Manager, Mentor Graphics
Traditional physical verification uses single-dimensional DRCs to identify sensitive layout features likely to fail during manufacturing. Checks that require coding large tables of measurement thresholds are extremely difficult to implement using traditional DRC approaches. A new technique known as eqDRC extends traditional DRC to define grouped multi-dimensional feature measurements using flexible mathematical expressions, providing a customizable physical modeling tool and enabling the analysis of complex interactions that could not previously be verified. This paper will examine the implementation and demonstrate the benefits of eqDRC through a variety of examples comparing traditional DRC with eqDRC approaches.