Heidi Barnes, Senior Consultant, Semiconductor Test Systems, Verigy
Fangyi Rao, Agilent Technologies
Tom Dagostino, Vice President, Device Modeling Division, Teraspeed
Sanjeev Gupta, Signal Integrity Applications Expert, Agilent Technologies
Al Neves, Senior Signal Integrity Engineer, Teraspeed
Mike Resso, Signal Integrity Applications Expert, Agilent Technologies
Bob Schaefer, R&D Project Manager, Agilent Technologies

The simple oscilloscope measurement techniques of the past are clearly struggling with the transmission-line effects of multi-gigabit data rates that are now commonplace in consumer products. The ability to accurately measure the performance of an electrical component is critical for guaranteeing its performance as a sub-element in a larger system or for improving the accuracy of system simulations and measurement-based models. This tutorial will focus on the practical side of understanding calibration techniques for obtaining wide-bandwidth data that is viable for use in time domain simulations and measurement-based modeling.