John Pickerd, Principal Engineer, Tektronix
Bill Hagerup, Principal Engineer, Tektronix
Kan Tan, Software Design Engineer, Tektronix

New technology makes full probe de-embed easy by attaching a probe to the DUT and pressing a calibration button. Switched loads at the tip allow the Thevenin-equivalent circuit for the DUT to be measured using only the active DUT signal, in contrast to a VNA or TDR, which require signal generators. A factory calibration of S-parameters for the probe and oscilloscope is used. DUT voltage with an arbitrary virtual load (including no load) can be obtained. Also, the impedance and return loss of the DUT test point can be computed. In addition, multiple interacting probes can be de-embedded and a real-time virtual test point is supported.