Thomas Zelder, RF Design Engineer, Universitat Hannover
Bernd Geck, Manager, Universitat Hannover
Ilona Rolfes, Manager, Universitat Hannover
Bernhard Rosenberger, General Manager, Research and Development, Rosenberger

After a short introduction to conventional vector network analysis, the principle and the implementation of a contactless measurement setup for the determination of the scattering parameters of embedded devices are presented. Suitable contactless and pseudo-contactless probes are developed for the implementation of the setup and calibration procedures that take the characteristic of the probes into account are described. For verification purposes the contactless measured results are compared with results received with a conventional vector network analyzer as well as with simulation results obtained with a 3D field simulator.