Hai Lan, Senior Member of the Technical Staff, Rambus
Ralf Schmitt, Engineering Manager, Rambus
Qi Xiaoning, Senior Member of the Technical Staff, Rambus
Chuck Yuan, Engineering Director, Rambus

This paper presents a systematic approach for analyzing supply Noise Induced timing jitter in high-speed I/O interfaces. The proposed method combines frequency-dependent supply noise jitter sensitivity profile with supply noise spectral content to predict the jitter generated by the supply noise. Distributed power grid model and device-level current profiles are used to obtain time and frequency domain supply noise. Jitter sensitivity is extracted by sweeping the frequency of single-tone disturbance added to ideal supply. Supply noise and jitter sensitivity are also measured by auto-correlation based on chip noise monitor circuits. The predicted supply noise-induced jitter is shown to correlate well with the measurement data.