Tuesday, February 5 | 2:00 – 2:20 Overview of the Latest Test Methodologies for High Speed Serial Designs TecPreview Theater | Exhibition Floor

Increasing data rates on the next generation Serial Data standards are creating new measurement challenges for all layers of the protocol stack. Tektronix understands these challenges and has a variety of tools available to address even the most complex of test requirements. This toolset includes solutions for signal integrity and compliance testing, receiver testing, digital validation and debug, and serial data link and network analysis. In this TecPreview we will touch on the most common as well the as the most challenging measurement tasks and how Tektronix solutions can help to better characterize and validate your high speed design.

Randy White, High-Speed Serial Applications Technical Marketing Manager, Tektronix
Randy White is the High Speed Serial Applications Technical Marketing Manager at Tektronix. Randy has worked with various aspects of test and measurement solutions at Tektronix over the past few years. He has given seminars on high-speed serial measurements and is actively involved in many working groups for high-speed serial standards. He holds a BSEE from Oregon State University in Corvallis, Oregon.

Tuesday, February 5 | 3:00 – 3:20 "A Closer Look into the Virtually-Probed Eye-Diagram to Unravel The "Closure" Caused by Noise and Jitter" TecPreview Theater | Exhibition Floor

Jitter Analysis of serial data streams has been complicated by the inclusion of equalization methods at both transmitter and receiver. So new methods of analysis are needed to analyze the jitter and noise performance of the virtually-probed "opened" eye. Such a new method involving a 2-dimensional statistical analysis of the eye-diagram is presented along with several new notions for quantifying channel performance. The method provides new graphical insight into interpreting eye diagrams in general.

Presenter

Martin T Miller, PhD, Chief Scientist at LeCroy Corp Martin Miller has been a hands-on engineer and designer at the company for 30 years. His doctorate is from the University of Rochester (Rochester, NY) in high-energy physics. A native of Baltimore, Dr. Miller has contributed analog, digital, and software designs to LeCroy's portfolio of test instruments. During the last 17 years he has focused on measurement-and-display software capabilities for LeCroy oscilloscopes. He holds several US patents and participates in task groups concerning jitter measurements for JEDEC. Recent publications include: Normalized Q-scale analysis: Theory and background -EDN, 3-16-2007 and A Comparison of Methods for Estimating Total Jitter Concerning Precision, Accuracy and Robustness -DesignCon 2007