8-TA3
Characterization of Gaussian Noise Sources
Tuesday, February 5 | 10:15 am – 10:55 am
Ransom Stephens, Writer, Physicist, Public Speaker, Ransom's Notes
Robert Muro, Senior Applications Engineer, NoiseCom
Key applications in high-rate serial data technologies assume that random jitter follows a Gaussian distribution and require that receivers be tested under the stress of a calibrated level of Gaussian random jitter. However, the most commonly available noise sources have never been rigorously characterized until now. We perform a complete statistical analysis of industry-standard noise sources and report on the extent to which the Gaussian assumption is valid. By including both statistical and systematic errors in a complete chi-squared covariance analysis, we show how to calculate the "goodness-of-fit" confidence level without resorting to the commonly used but inadequate least-squares approach.
Robert Muro, Senior Applications Engineer, NoiseCom






