1-TP1
Design and Application of Embedded Waveform Viewing Technology for Integrated Circuits
Tuesday, February 5 | 2:00 pm – 2:40 pm
Gary McCormack, Vitesse Semiconductor
Eric Sweetman, Vitesse Semiconductor
Ian Kyles, Vitesse Semiconductor
The design, implementation, and performance of an IC-based embedded signal waveform viewing technology will be discussed. This technology is incorporated into the first decision circuit in a high-speed serial data receiver, enabling the received data eye to be scanned in a manner very similar to oscilloscopes. By locating this function at the point of decision, the performance of a preceding integrated equalizer can be directly viewed (and tuned) prior to clocking. The benefits of this technology can be far-reaching, with immediate benefits to the signal integrity engineer, along with improved manufacturability and reduced operational expenses for the end customer.
Eric Sweetman, Vitesse Semiconductor
Ian Kyles, Vitesse Semiconductor
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