Serial Data Network Analysis by Tektronix: How to more accurately characterize high-speed serial channel performance
Wednesday, January 31 | 2:00 pm - 2:20 pm | TecPreview Theater
Increasing data rates on next generation Serial Data standards are creating new measurement challenges for the PHY Layer. The higher data rates are putting pressure on designers to understand link performance limitations in much greater detail and accuracy. Tektronix understands this need and has introduced in 2006 a new High-Speed Serial Data Network Analysis toolset. This toolset enables more accurate channel and interconnect analysis through a repeatable true set of differential measurements and S parameter analysis. This TecPreview will provide the engineer with information on Tektronix' new Serial Data Network Analyzer and how it can better characterize a design's link performance in a high-speed design.
Presenter
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Eugene Mayevskiy
Applications Engineer
Tektronix, Inc.
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Eugene Mayevskiy holds the B.S.E.E and M.S.E.E. degrees from Oregon State University where he has done substantial research on measurement-based modeling and analysis of passive devices fabricated for radio frequency integrated circuits. He is currently with Tektronix working on leading interconnect signal integrity and failure analysis products. His responsibilities include product development, training and problem resolution for TDR/VNA measurement, modeling and SPICE/IBIS circuit simulation. He has published a number of papers and given seminars on measurement-based modeling for high-speed designs.
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