Mike Li, Chief Technology Officer, Wavecrest

Insuring signaling, jitter, and noise at multiple-Gbps data rates has become increasingly difficult and challenging for designers and engineers of systems and components. This paper and TecForum will review some of the latest developments in multiple-Gbps technologies in both computer applications (e.g., PCI-Express, Serial ATA Gen, FB-DIMM) and network applications (e.g., FC, GBE). Emerging test challenges are outlined, along with the illustration of possible solutions. Additionally, a brief review of measurement equipment used for clock and data analysis, including signal integrity analyzers, BER testers, and oscilloscopes, will be provided to determine how each instrument fits into the overall signal analysis picture.