Dima Smolyansky, Director, Tektronix

Designers of digital systems running at gigabit speeds are on a constant search for efficient, easy-to-use and cost-effective signal integrity analysis solutions for measurement-based performance evaluation of gigabit interconnect links and devices. In this TecForum, we will present interconnect analysis and modeling techniques in both time (TDR/T) and frequency (VNA) domains. We will present techniques for cost-effective interconnect compliance testing, including S-parameter and eye-diagram mask tests. These techniques will provide a path for efficient computation and analysis of differential insertion and return loss, crosstalk, and eye diagram.