DesignCon 2007

Connecting the World of Electronic Design

DesignCon Paper Awards recognize outstanding contributions to the educational goals of the DesignCon program. Papers are judged both on the merits of the written document and on the quality of their presentation at DesignCon 2007.

Congratulations to the DesignCon Paper Award Winners:

Application-Specific Design

1-TP2 | Optimizing Memory Interfaces for Specific Applications

Olivier Despaux, Senior Strategic Applications Engineer, Xilinx

Chip-Level Functional Design

2-TP2 | IP Solves the Increasing Challenge of Implementing an Interface to Off-Chip DDR SDRAM

Graham Allan, Director, Marketing, MOSAID Technologies Incorporated
Jody Defazio, Director, Engineering, MOSAID Technologies Incorporated

5-WP1 | Packaging a Supercomputer in a PCI Express Form Factor

Greg Edlund, Senior Engineer, IBM

Functional Verification

3-WA2 | Planning Formal Verification Closure

Harry Foster, Principal Engineer, Mentor Graphics
Ping Yeung, Principal Engineer, Mentor Graphics

Board-Level Design

10-TP1 | Applications of Optimization Routines in Signal Integrity Analysis

Pat Zabinski, Principal Engineer, Mayo Clinic
Ben Buhrow, Project Engineer, Mayo Clinic
Barry Gilbert, Ph.D., Staff Scientist and Director, Mayo Clinic
Erik Daniel, Ph.D., Staff Scientist and Deputy Director, Mayo Clinic

Interconnect Design

7-TA4-1 | Improving the Reach-Gauge Tradeoff in Copper Cable Interconnects

Andrew Kim, Senior System Architect, Quellan
Michael Vrazel, Technical Director, Quellan

System-Level Design

8-TA3 | Simultaneous Jitter Analysis in Time, Frequency, and Statistical Domains and Their Interrelationships

Mike Li, Chief Technical Officer, Wavecrest

Power and Test

12-TA4 | Comparing Time-Domain and Frequency Domain Techniques for Investigation on Charge Delivery and Power-Bus Noise for High-Speed Printed Circuit Boards

James Drewniak, Professor, University of Missouri-Rolla
Giuseppe Selli, Graduate Student, University of Missouri-Rolla
Jun Fan, Consultant Engineer, NCR
James L. Knighten, Technical Consultant, NCR
Bruce Archambeault, Distinguished Engineer, IBM
Malteo Cocchini, Ph.D. Student, University of Missouri-Rolla
Samuel Connor, Senior Engineer, IBM
Liang Xue, Engineer, National Semiconductor

13-WA1 | A Method for Testing Jitter Tolerance of SerDes Receivers Using Random Jitter

Masahiro Ishida, Researcher, Advantest Laboratories
Takahiro J. Yamaguchi, Manager, Advantest Laboratories
Mani Soma, Professor, University of Washington

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