Signal Integrity Workshop at DesignCon 2007
Santa Clara Convention Center, January 30, 2007
Submission Deadline: Monday, October 30, 2006
SI Workshop: Tuesday, January 30, 2007
The International Engineering Consortium is pleased to announce this Call for Test Cases for a Signal Integrity Workshop at DesignCon 2007. The workshop will provide an opportunity to learn from experts in signal integrity test and measurement as they tackle challenging test cases. Leading vendors in the field will contribute equipment and expertise to the workshop.
We are seeking actual designs—boards, backplanes, connectors, cables, chips—to use as test cases for the workshop. Test case volunteers must have a completed device or prototype they can bring to the workshop for testing. They must also be willing to allow their test case to be presented to the workshop audience.
The SI Workshop at DesignCon 2007 will focus on using TDR (time-domain reflectometry) for SI testing. The workshop will be held at the Santa Clara Convention Center on Tuesday, January 30, at 10:15 am - 11:45 am.
TDR/TDT Test Measurements
- Impedance, propagation, skew, and fault location measurements
- Frequency domain analysis including S-parameters
Available Test Equipment
- Agilent 86100C TDR system and Agilent VNAs
- Tektronix CSA8200 Sampling Oscilloscope with TDR Module (80E10) and differential probe
- LeCroy SDA100G Sampling Oscilloscope with 4 ST-20 TDR/sampling head
Please fill out the Online Questionnaire for qualification.
For More Information Contact:
Barry SullivanDesignCon 2007 Conference Director
+1-312-559-3302 phone
+1-312-559-4127 fax
bsullivan@iec.org
