7-WP2
Single-Port TDR Test for Calibrated Two-Port S-Parameters
Wednesday, February 8 | 2:50 pm - 3:30 pm
James Mayrand, Complete DVT Solutions
Brian Shumaker, Complete DVT Solutions
This presentation will show how to debug IP port applications, characterizing system interconnect to transceiver IC by using an easy one-port TDR test to extract S-parameters and quickly isolate component failures by analyzing eye patterns and impedance profiles. This analysis creates an opportunity to balance IC and PCB RF performance and minimize repair costs. As an example, a USB failure was characterized and repaired.




































