Ralf Schmitt, Ph.D., Signal Integrity Engineer, Rambus, Inc.
Chuck Yuan, Ph.D., Signal Integrity Manager, Rambus, Inc.
Woopoung Kim, Ph.D., Member of Technical Staff, Rambus, Inc.

This paper describes the modeling of power supply noise in a high-bandwidth XDR™ DRAM memory system and the correlation with measurement results in time domain while the system is operating. A supply network model is presented that allows prediction of worst-case supply noise outside as well as inside the device packages. Comparison of simulation results with measurements outside the package show excellent correlation, verifying the modeling approach.