2005 Archive
Highlights | Schedule | Exhibitor List
7-TP2
Eye Pattern Measurements on Scopes
Tuesday, February 1 | 2:50pm - 3:30pm
Peter Pupalaikis, Principal Technologist, LeCroy
Eric Yudin, Development Engineer, LeCroy
There is much industry confusion regarding how eye patterns look when measured in scopes. This confusion is related to the characteristics of serial data and the characteristics of scopes. This paper and an accompanying software tool called IRIS is presented to provide education on the interaction of serial data and scope characteristics in measurements.




































